[IEEE International Electron Devices Meeting. Technical...

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[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - A technology simulation methodology for AC-performance optimization of SiGe HBTs

Johnson, J.B., Stricker, A., Joseph, A.J., Slinkman, J.A.
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Year:
2001
Language:
english
DOI:
10.1109/iedm.2001.979552
File:
PDF, 363 KB
english, 2001
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