[IEEE 2007 IEEE International Electron Devices Meeting -...

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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Experimental Investigation on Superior PMOS Performance of Uniaxial Strained ≪110≫ Silicon Nanowire Channel By Embedded SiGe Source/Drain

Li, Ming, Yeo, Kyoung Hwan, Yeoh, Yun Young, Suk, Sung Dae, Cho, Keun Hwi, Kim, Dong-Won, Park, Donggun, Lee, Won-Seong
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Year:
2007
Language:
english
DOI:
10.1109/iedm.2007.4419095
File:
PDF, 3.68 MB
english, 2007
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