[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Developing a universal exchange format for near-field scan data
Shepherd, John, Nakamura, Atsushi, Lafon, Frederic, Sicard, Etienne, Ramdani, Mohamed, Pommerenke, David, Muchaidze, Giorgi, Serpaud, SebastienYear:
2009
Language:
english
DOI:
10.1109/isemc.2009.5284701
File:
PDF, 129 KB
english, 2009