![](/img/cover-not-exists.png)
Successive pattern classification based on test feature classifier and its application to defect image classification
Yukinobu Sakata, Shuni’chi Kaneko, Yuji Takagi, Hirohito OkudaVolume:
38
Year:
2005
Language:
english
Pages:
10
DOI:
10.1016/j.patcog.2005.04.013
File:
PDF, 399 KB
english, 2005