Successive pattern classification based on test feature...

Successive pattern classification based on test feature classifier and its application to defect image classification

Yukinobu Sakata, Shuni’chi Kaneko, Yuji Takagi, Hirohito Okuda
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Volume:
38
Year:
2005
Language:
english
Pages:
10
DOI:
10.1016/j.patcog.2005.04.013
File:
PDF, 399 KB
english, 2005
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