A new measure of symmetry and its application to...

Pattern Recognition 2007 Vol. 40; Iss. 8

A new measure of symmetry and its application to classification of bifurcating structures

David Milner, Shmuel Raz, Hagit Hel-Or, Daniel Keren, Eviatar Nevo
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Volume:
40
Year:
2007
Language:
english
Pages:
14
DOI:
10.1016/j.patcog.2006.12.008
File:
PDF, 1017 KB
english, 2007
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