[IEEE 2012 12th International Workshop on Junction Technology (IWJT) - Shanghai (2012.05.14-2012.05.15)] 2012 12th International Workshop on Junction Technology - Numerical simulation of static and dynamic operation performance of SOI VLT LDMOS considering electrical-thermal couple effects
Jun Huang,, Tingting Hua,, Yufeng Guo,, Yue Xu,, Xiaojuan Xia,, Ying Zhang,, Sheu, G.Year:
2012
Language:
english
DOI:
10.1109/iwjt.2012.6212832
File:
PDF, 1.04 MB
english, 2012