Correlation between Microwave Reflectivity and Excess Carrier Concentrations in 4H-SiC
Kato, Masashi, Mori, Yuto, Ichimura, MasayaVolume:
778-780
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.778-780.293
Date:
February, 2014
File:
PDF, 274 KB
english, 2014