[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Large scale integration and reliability consideration of triple gate transistors
Jung A Choi,, Kwon Lee,, You Seung Jin,, Yong Jun Lee,, Soo Yong Lee,, Geon Ung Lee,, Scung Hwan Lee,, Min Chul Sun,, Dong Chan Kim,, Young Mi Lee,, Su Gon Bae,, Jeong Hwan Yang,, Maeda, SYear:
2004
Language:
english
DOI:
10.1109/iedm.2004.1419249
File:
PDF, 261 KB
english, 2004