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[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - On the PBTI degradation of pMOSFETs and its impact on IC lifetime
Schlunder, Christian, Reisinger, Hans, Aresu, Stefano, Gustin, WolfgangYear:
2011
Language:
english
DOI:
10.1109/iirw.2011.6142576
File:
PDF, 544 KB
english, 2011