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Effects of ion damage on IBICC and SEU imaging
Sexton, F.W., Horn, K.M., Doyle, B.L., Shaneyfelt, M.R., Meisenheimer, T.L.Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.489238
Date:
January, 1995
File:
PDF, 912 KB
english, 1995