Secondary ion mass spectroscopy and synchrotron X-ray...

Secondary ion mass spectroscopy and synchrotron X-ray fluorescence in the study of the qualitative variation in metal content with time in tree rings

Martin, Ronald R, Sham, T K, Won, G Wong, van der Heide, Paul, Jones, Keith W, Song, Sheng-Rong, Protz, Richard
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Volume:
28
Language:
english
Journal:
Canadian Journal of Forest Research
DOI:
10.1139/x98-131
Date:
October, 1998
File:
PDF, 239 KB
english, 1998
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