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[IEEE 2011 5th International IEEE/EMBS Conference on Neural Engineering (NER) - Cancun, Mexico (2011.04.27-2011.05.1)] 2011 5th International IEEE/EMBS Conference on Neural Engineering - Evaluation of negative photo-patternable PDMS for the encapsulation of neural electrodes
Delivopoulos, Evangelos, Minev, Ivan R., Lacour, Stephanie P.Year:
2011
Language:
english
DOI:
10.1109/ner.2011.5910593
File:
PDF, 766 KB
english, 2011