[IEEE Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 2000 - San Jose, CA, USA (21-23 March 2000)] Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.00CH37068) - High efficiency active cooling system
Dziurdzia, P., Kos, A.Year:
2000
Language:
english
DOI:
10.1109/stherm.2000.837057
File:
PDF, 543 KB
english, 2000