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[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Effective voiding control of QFN via solder mask patterning
Herron, Derrick, Liu, Yan, Lee, Ning-ChengYear:
2013
Language:
english
DOI:
10.1109/ectc.2013.6575613
File:
PDF, 1.71 MB
english, 2013