[IEEE 2013 IEEE 63rd Electronic Components and Technology...

  • Main
  • [IEEE 2013 IEEE 63rd Electronic...

[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Effective voiding control of QFN via solder mask patterning

Herron, Derrick, Liu, Yan, Lee, Ning-Cheng
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2013
Language:
english
DOI:
10.1109/ectc.2013.6575613
File:
PDF, 1.71 MB
english, 2013
Conversion to is in progress
Conversion to is failed