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[IEEE 2011 Spanish Conference on Electron Devices (CDE) - Palma de Mallorca, Spain (2011.02.8-2011.02.11)] Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 - Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices
Lopez-Calle, I., Franco, F. J., Agapito, J. A., Izquierdo, J. G.Year:
2011
Language:
english
DOI:
10.1109/sced.2011.5744202
File:
PDF, 1.12 MB
english, 2011