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[IEEE 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Crete, Greece (2007.07.8-2007.07.11)] 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Highly Reliable Power Aware Memory Design
Argyrides, Costas, Pradhan, Dhiraj K.Year:
2007
Language:
english
DOI:
10.1109/iolts.2007.37
File:
PDF, 196 KB
english, 2007