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[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Testing "untestable" faults in three-state circuits
Wohl, P., Waicukauski, J., Graf, M.Year:
1996
Language:
english
DOI:
10.1109/vtest.1996.510875
File:
PDF, 880 KB
english, 1996