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[IEEE 2010 International Conference on Green Circuits and Systems (ICGCS) - Shanghai, China (2010.06.21-2010.06.23)] The 2010 International Conference on Green Circuits and Systems - Process optimization for a high gate trench MOS to minimize threshold voltage variation

Shan, Zhongfei, Wang, Guoxing, Zhu, Yongxin, Rong, Guoguang
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Year:
2010
Language:
english
DOI:
10.1109/icgcs.2010.5543014
File:
PDF, 930 KB
english, 2010
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