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[IEEE 2012 International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2012.11.11-2012.11.15)] The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems - An influence of oblique-angle sputtering on ZnO:Ga thin film properties
Flickyngerova, S., Netrvalova, M., Sutta, P., Novotny, I., Tvaroxek, V.Year:
2012
Language:
english
DOI:
10.1109/asdam.2012.6418515
File:
PDF, 473 KB
english, 2012