[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Test Economics ¿ What can a Board/System Test Engineer do to Influence Supply Operation Metrics
Tourangeau, Sylvain, Eklow, BillYear:
2006
Language:
english
DOI:
10.1109/test.2006.297650
File:
PDF, 278 KB
english, 2006