[IEEE 2006 IEEE International Test Conference - Santa...

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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Test Economics ¿ What can a Board/System Test Engineer do to Influence Supply Operation Metrics

Tourangeau, Sylvain, Eklow, Bill
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Year:
2006
Language:
english
DOI:
10.1109/test.2006.297650
File:
PDF, 278 KB
english, 2006
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