[IEEE 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) - Taipei, Taiwan (03-05 Aug. 2005)] 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) - Novel Self-Convergent Scheme Logic-Process-Based Multilevel/Analog EEPROM Memory
Kung-Hong Lee,, Shih-Chen Wang,, Ya-Chin King,Year:
2005
Language:
english
DOI:
10.1109/mtdt.2005.29
File:
PDF, 186 KB
english, 2005