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[IEEE 1996 IEEE International SOI Conference Proceedings - Sanibel Island, FL, USA (30 Sept.-3 Oct. 1996)] 1996 IEEE International SOI Conference Proceedings - Positive charge trapping in SOI materials
Lawrence, R.K., Mrstik, B.J., Hughes, H.L., McMarr, P.J., Anc, M.J.Year:
1996
Language:
english
DOI:
10.1109/soi.1996.552480
File:
PDF, 190 KB
english, 1996