[IEEE 2012 IEEE Custom Integrated Circuits Conference - CICC 2012 - San Jose, CA, USA (2012.09.9-2012.09.12)] Proceedings of the IEEE 2012 Custom Integrated Circuits Conference - Compact and behavioral modeling of transistors from NVNA measurements: New flows and future trends
Root, D. E., Xu, J., Sischka, F., Marcu, M., Horn, J., Biernacki, R. M., Iwamoto, M.Year:
2012
Language:
english
DOI:
10.1109/cicc.2012.6330642
File:
PDF, 1.14 MB
english, 2012