![](/img/cover-not-exists.png)
[IEEE 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192) - Baltimore, MD, USA (7-12 June 1998)] 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192) - DC-to-mm-wave absolute potential measurements inside digital microwave ICs using a micromachined photoconductive sampling probe
David, G., Whitaker, J.F., Weatherford, T.R., Jobe, K., Meyer, S., Bustamante, M., Goyette, W., Thomas, S., Elliott, K.Volume:
3
Year:
1998
Language:
english
DOI:
10.1109/mwsym.1998.700620
File:
PDF, 456 KB
english, 1998