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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Testing for resistive opens and stuck opens
Li, J.C.M., Chao-Wen Tseng,, McCluskey, E.J.Year:
2001
Language:
english
DOI:
10.1109/test.2001.966731
File:
PDF, 968 KB
english, 2001