Frequency-Dependent Substrate Characterization via an...

IEEE Microwave and Wireless Components Letters 2011 / 04 Vol. 21; Iss. 4

Frequency-Dependent Substrate Characterization via an Iterative Pole Search Algorithm

Demeester, Thomas, Cauwe, Maarten, De Zutter, Daniël
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Volume:
21
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/lmwc.2011.2109374
Date:
April, 2011
File:
PDF, 294 KB
english, 2011
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