Highly Accurate Management in Dynamically Changing Fab
Imaoka, K., Ishii, Y., Kikuchi, T., Sugawa, S., Nagahira, A.Volume:
22
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2009.2031773
Date:
November, 2009
File:
PDF, 1.77 MB
english, 2009