![](/img/cover-not-exists.png)
[IEEE 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2008.04.21-2008.04.23)] 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Abnormally High Current Local Fluctuations in Heavily Pocket-implanted Bulk Long MOSFET
Cathignol, Augustin, Bordez, Samuel, Cros, Antoine, Rochereau, Krysten, Ghibaudo, GerardYear:
2008
Language:
english
DOI:
10.1109/vtsa.2008.4530850
File:
PDF, 1.48 MB
english, 2008