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[IEEE 2006 IFIP International Conference on Very Large Scale Integration - Nice, France (2006.10.16-2006.10.18)] 2006 IFIP International Conference on Very Large Scale Integration - Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Papanikolaou, Antonis, Miranda, Miguel, Wang, Hua, Catthoor, Francky, Satyakiran, Munaga, Marchal, Pol, Kaczer, Ben, Bruynseraede, Christophe, Tokei, ZsoltYear:
2006
Language:
english
DOI:
10.1109/vlsisoc.2006.313258
File:
PDF, 1.09 MB
english, 2006