[IEEE 2014 IEEE International Reliability Physics Symposium...

  • Main
  • [IEEE 2014 IEEE International...

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Defects characterization of Hybrid Floating Gate/Inter-Gate Dielectric interface in Flash memory

Zahid, M. B., Degraeve, R., Breuil, L., Blomme, P., Lisoni, J. G., Van den Bosch, G., Van Houdt, J., Tang, B.J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6860601
File:
PDF, 425 KB
english, 2014
Conversion to is in progress
Conversion to is failed