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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Defects characterization of Hybrid Floating Gate/Inter-Gate Dielectric interface in Flash memory
Zahid, M. B., Degraeve, R., Breuil, L., Blomme, P., Lisoni, J. G., Van den Bosch, G., Van Houdt, J., Tang, B.J.Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6860601
File:
PDF, 425 KB
english, 2014