[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - DCIATP-an iterative analog circuit test generation program for generating DC single pattern tests
Marlett, M.J., Abraham, J.A.Year:
1988
Language:
english
DOI:
10.1109/test.1988.207871
File:
PDF, 552 KB
english, 1988