High-Resolution TEM Analysis of Perpendicular...

IEEE Transactions on Magnetics 2008 / 11 Vol. 44; Iss. 11

High-Resolution TEM Analysis of Perpendicular CoCrPt-SiO$_{2}$ Media

Araki, R., Takahashi, Y., Takekuma, I., Narishige, S.
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Volume:
44
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2008.2002415
Date:
November, 2008
File:
PDF, 817 KB
english, 2008
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