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[IEEE 2012 IEEE Custom Integrated Circuits Conference - CICC 2012 - San Jose, CA, USA (2012.09.9-2012.09.12)] Proceedings of the IEEE 2012 Custom Integrated Circuits Conference - Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables
Yu, Bo, Li, Xin, Yonemura, James, Wu, Zhiyuan, Goo, Jung-Suk, Thuruthiyil, Ciby, Icel, AliYear:
2012
Language:
english
DOI:
10.1109/cicc.2012.6330573
File:
PDF, 1.65 MB
english, 2012