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[IEEE 2012 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2012.05.30-2012.06.1)] 2012 IEEE International Conference on IC Design & Technology - Variability in Fully Depleted MOSFETs

Vinet, M., Hook, T., Le Tiec, Y., Murphy, R., Ponoth, S., Grenouillet, L., Wacquez, R.
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Year:
2012
Language:
english
DOI:
10.1109/icicdt.2012.6232868
File:
PDF, 1.17 MB
english, 2012
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