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[IEEE 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Bangalore, India (2012.07.24-2012.07.28)] 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials - Electrical aging markers for low-voltage cable insulation wiring of nuclear power plants
Verardi, L., Fabiani, D., Montanari, G. C., Placek, V.Year:
2012
Language:
english
DOI:
10.1109/icpadm.2012.6318966
File:
PDF, 1.57 MB
english, 2012