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Molecular beam epitaxy of - films on Si(111) substrates and its influence on minority-carrier diffusion length of Si measured by EBIC
H. Kawakami, M. Suzuno, K. Akutsu, J. Chen, Y. Fuxing, T. Sekiguchi, T. SuemasuVolume:
11
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.phpro.2011.01.029
File:
PDF, 401 KB
english, 2011