Radiation damage to charge coupled devices in the space environment
Yamashita, A., Dotani, T., Bautz, M., Crew, G., Ezuka, H., Gendreau, K., Kotani, T., Mitsuda, K., Otani, C., Rasmussen, A., Ricker, G., Tsunemi, H.Volume:
44
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.603763
Date:
June, 1997
File:
PDF, 802 KB
english, 1997