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[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Analysis of the FinFET parasitics for improved RF performances
Parvais, B., Dehan, M., Subramanian, V., Mercha, A., San, K. Tamer, Jurczak, M., Groeseneken, G., Sansen, W., Decoutere, S.Year:
2007
Language:
english
DOI:
10.1109/soi.2007.4357841
File:
PDF, 879 KB
english, 2007