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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - A case study of ir-drop in structured at-speed testing
Saxena, J., Butler, K.M., Jayaram, V.B., Kundu, S., Arvind, N.V., Sreeprakash, P., Hachinger, M.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/TEST.2003.1271098
File:
PDF, 815 KB
english, 2003