[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - DfT for full accessibility of multi-step analog to digital converters
Zjajo, Amir, de Gyvez, Jose PinedaYear:
2008
Language:
english
DOI:
10.1109/vdat.2008.4542415
File:
PDF, 2.97 MB
english, 2008