[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Voltage scaling limitations and challenges of memory-rich nanoscale CMOS LSIs
Itoh, Kiyoo, Tsuchiya, RyutaYear:
2010
Language:
english
DOI:
10.1109/MIEL.2010.5490536
File:
PDF, 1.04 MB
english, 2010