Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2013 / 07 Vol. 7; Iss. 4
Electron-microscopy study of the distribution of dopants (Ta) in Si-C nanocomposite films
M. Yu. Presnyakov,A. I. Popov…Volume:
7
Language:
english
Journal:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451013030312
Date:
July, 2013
File:
PDF, 1.85 MB
english, 2013