Atomic force microscopy on surfaces with a developed...

Atomic force microscopy on surfaces with a developed profile

A. G. Temiryazev,V. I. Borisov…
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Volume:
8
Language:
english
Journal:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451014030161
Date:
July, 2014
File:
PDF, 1.52 MB
english, 2014
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