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Metrological assurance of measurements of the dimensional parameters of nanoparticles and thin films by small-angle X-ray diffractometry methods
A. S. Avilov,V. V. Volkov,S. P. Gubin,Yu. A. Dyakova…Volume:
8
Language:
english
Journal:
Nanotechnologies in Russia
DOI:
10.1134/S1995078013030026
Date:
May, 2013
File:
PDF, 388 KB
english, 2013