Surface recombination evaluation of a silicon wafer by...

Surface recombination evaluation of a silicon wafer by using the photoluminescence intensity ratio method for solar cell applications

Dohyun Baek,Jaehyeong Lee,Byoungdeog Choi
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Volume:
65
Language:
english
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.65.336
Date:
August, 2014
File:
PDF, 1.40 MB
english, 2014
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