Surface recombination evaluation of a silicon wafer by using the photoluminescence intensity ratio method for solar cell applications
Dohyun Baek,Jaehyeong Lee,Byoungdeog ChoiVolume:
65
Language:
english
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.65.336
Date:
August, 2014
File:
PDF, 1.40 MB
english, 2014