Photoluminescence characterization of thermal defects in...

Photoluminescence characterization of thermal defects in Czochralski grown silicon heat treated at 600°C

V.V. Emtsev, A.V. Mudryi, V.V. Emtsev Jr., D.S. Poloskin, G.A. Oganesyan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
340-342
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2003.09.209
File:
PDF, 201 KB
english, 2003
Conversion to is in progress
Conversion to is failed