Residual stress and structural characteristics in Ti and Cu...

Residual stress and structural characteristics in Ti and Cu sputtered films on glass substrates at different substrate temperatures and film thickness

Hadi Savaloni, Ali Taherizadeh, Akbar Zendehnam
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Volume:
349
Year:
2004
Language:
english
Pages:
12
DOI:
10.1016/j.physb.2004.01.158
File:
PDF, 348 KB
english, 2004
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