Complementary neutron and X-ray reflectivity for structural characterization of porous thin films
Yu-Shan Huang, U-Ser Jeng, Chia-Hung Hsu, Naoya Torikai, Hsin-Yi Lee, Kwanwoo Shin, Masahiro HinoVolume:
385-386
Year:
2006
Language:
english
Pages:
3
DOI:
10.1016/j.physb.2006.06.122
File:
PDF, 213 KB
english, 2006