Complementary neutron and X-ray reflectivity for structural...

Complementary neutron and X-ray reflectivity for structural characterization of porous thin films

Yu-Shan Huang, U-Ser Jeng, Chia-Hung Hsu, Naoya Torikai, Hsin-Yi Lee, Kwanwoo Shin, Masahiro Hino
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
385-386
Year:
2006
Language:
english
Pages:
3
DOI:
10.1016/j.physb.2006.06.122
File:
PDF, 213 KB
english, 2006
Conversion to is in progress
Conversion to is failed