A new computer method of image analysis applied to...

A new computer method of image analysis applied to semiconductor's structural characterization

M.A. Hernández-Fenollosa, D. Cuesta-Frau, L.C. Damonte, P. Micó-Tormos
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Volume:
389
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.physb.2006.07.029
File:
PDF, 678 KB
english, 2007
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