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Analysis of frequency-dependent series resistance and interface states of In/SiO2/p-Si (MIS) structures
A. Birkan Selçuk, N. Tuğluoğlu, S. Karadeniz, S. Bilge OcakVolume:
400
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.physb.2007.06.031
File:
PDF, 506 KB
english, 2007